We are currently experiencing degraded performance with our storage system. We greatly appreciate your patience and we apologize for the general slowness and any inconvenience. Click here to join our chat for updates.

CERN Accelerating science

RD53 Conference Proceedings

Ultimi arrivi:
2016-11-09
21:46
Results of FE65-P2 Pixel Readout Test Chip for High Luminosity LHC Upgrades / Garcia-Sciveres, Mauricio (Lawrence Berkeley National Lab. (US)) /RD53 Collaboration
A pixel readout test chip called FE65-P2 has been fabricated on 65 nm CMOS technology. FE65-P2 contains a matrix of 64 x 64 pixels on 50 micron by 50 micron pitch, designed to read out a bump bonded sensor. [...]
CERN-RD53-PROC-16-001.- Geneva : CERN, 2016 - 8. - Published in : PoS ICHEP2016 (2016) 272 Fulltext: PDF; ICHEP submission: PDF;
In : 38th International Conference on High Energy Physics, Chicago, IL, USA, 03 - 10 Aug 2016, pp.272

Record dettagliato - Record simili