New Scanning Electron Microscope Used for Cryogenic Tensile Testing

About this image

• Photographer: Maximilien Brice
• Taken: 10 Jan 2013
• Uploaded: 14 Jan 2013
• Record last updated: 20 Nov 2024
• Keywords: Knowledge Transfer & Technology

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© CERN Some rights reserved. This image is freely available for non-commercial use.

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