 | : Continuous n-implant |
 | : Segmented n-implant |
 | Telescope setup at the DESY II test-beam facility. The DUT is placed between three MIMOSA-26 planes in the upstream and downstream arm, respectively. An additional Timepix3 plane is placed behind the last MIMOSA-26 plane in the downstream arm. |
 | In-pixel telescope track position as a function of reconstructed in-pixel cluster position for the pixel flavour with segmented n-implant at a threshold of 178\,e. The 5th order polynomial fitted to the distribution (shown as red line) is defined as $\eta$-function. |
 | Cluster size in column direction for the pixel flavour with and without segmentation of the n-implant at nominal conditions. The error bars reflecting the statistical uncertainty are not visible. |
 | Cluster size in row direction for the pixel flavour with and without segmentation of the n-implant at nominal conditions. The error bars reflecting the statistical uncertainty are not visible. |
 | : In-pixel cluster size for the flavour with continuous n-implant at nominal conditions. |
 | : In-pixel cluster size for the flavour with segmented n-implant at nominal conditions. |
 | : In-pixel cluster column size for the flavour with continuous n-implant at nominal conditions. |
 | : In-pixel cluster column size for the flavour with segmented n-implant at nominal conditions. |
 | : Mean cluster size in column direction as a function of detection threshold. The hatched band represents the statistical and systematic uncertainties. |
 | : Mean cluster size in row direction as a function of detection threshold. The hatched band represents the statistical and systematic uncertainties. |
 | Cluster seed signal distribution for both pixel flavours at nominal conditions. The error bars reflecting the statistical uncertainty are not visible. |
 | : Hit detection efficiency as a function of threshold for both pixel flavours. The hatched band represents the statistical and systematic uncertainties. |
 | : Hit detection efficiency as a function of threshold for low thresholds. The hatched band represents the statistical and systematic uncertainties. |
 | In-pixel hit detection efficiency at a threshold of 1950\,e$^-$ for the pixel flavour with continuous n-implant. |
 | Residuals in column direction between track intercept position and reconstructed cluster position on the CLICTD. The error bars reflecting the statistical uncertainty are not visible. |
 | : Spatial resolution in row direction as a function of threshold for both pixel flavours. The hatched band represents the statistical and systematic uncertainties. |
 | : Spatial resolution in column direction as a function of threshold for both pixel flavours. The hatched band represents the statistical and systematic uncertainties. |
 | Residual between track timestamp and reconstructed cluster timestamp as a function of seed pixel charge before time-walk correction for the pixel flavour with continuous n-implant. The black crosses denote the mean of each ToT bin. |
 | Residual between track timestamp and reconstructed cluster timestamp as a function of seed pixel charge after time-walk correction for the pixel flavour with continuous n-implant. The black crosses denote the mean of each ToT bin. |
 | : In-pixel time residuals for the pixel flavour with continuous n-implant before time-walk correction. |
 | : In-pixel time residuals for the pixel flavour with segmented n-implant before time-walk correction. |
 | : In-pixel time residuals for the pixel flavour with continuous n-implant after time-walk correction. |
 | : In-pixel time residuals for the pixel flavour with segmented n-implant after time-walk correction. |
 | Time residuals between track timestamp and CLICTD timestamp after time-walk correction. The error bars reflecting the statistical uncertainty are not visible. |
 | Time resolution as a function of the detection threshold. The hatched band represents the statistical and systematic uncertainties. |