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The invariant mass distribution of pairs of (left) electrons and (right) muons observed in data (black dots with statistical error bars) and expected from the SM processes (stacked histograms). The bin width gradually increases with mass \cite{bib:pas_cms_exo_19_019}. The ratio of the data yields after background subtraction to the background yields is shown on the bottom plots. The blue band represents the various statistical and systematic uncertainties on the background.

Dimuon invariant mass distributions of events selected with the standard and scouting dimuon triggers \cite{bib:cms_lowmass_dimuon}. The distribution shown in red corresponds to the data collected using the standard triggers, corresponding to a total integrated luminosity of 137 $\mathrm{fb^{-1}}$. The distribution shown in green corresponds to the data collected using the scouting muon triggers, corresponding to a total integrated luminosity of 96.6 $\mathrm{fb^{-1}}$. The inset figure shows the dimuon mass distribution of events in the barrel category in the mass range 23.9-26.1 GeV. A function describing the background is fit to this data and a 25 GeV dark photon signal is added.

Distribution of the two lepton two jet invariant mass in the signal region for the electron (left) and muon (right) channels \cite{bib:cms_excitedlepton}. The example signal shape for two excited lepton masses is indicated as a grey line with the parameters given in the legend. The panel below shows the data/MC ratio with the total uncertainty in grey.

The plot on the left shows an overview of total contributions (single bin) for the double muon object group, showing exclusive event that contain two muons and different number of jets and b-jets. The numbers on the top of each bin indicate the observed p-value for the agreement of data and simulation for the corresponding event class. The plot on the right shows the invariant mass distribution for the double muon exclusive event class. Measured data are shown as black markers, contributions from SM processes are represented by coloured bars, and the regions enclosed by red dashed lines correspond to the region of interest (contiguous set of bins with lowest p-value) \cite{bib:pas_cms_exo_19_008}.

The plot on the left shows an overview of total contributions (single bin) for the double muon object group, showing exclusive event that contain two muons and different number of jets and b-jets. The numbers on the top of each bin indicate the observed p-value for the agreement of data and simulation for the corresponding event class. The plot on the right shows the invariant mass distribution for the double muon exclusive event class. Measured data are shown as black markers, contributions from SM processes are represented by coloured bars, and the regions enclosed by red dashed lines correspond to the region of interest (contiguous set of bins with lowest p-value) \cite{bib:pas_cms_exo_19_008}.

The invariant mass distribution of pairs of (left) electrons and (right) muons observed in data (black dots with statistical error bars) and expected from the SM processes (stacked histograms). The bin width gradually increases with mass \cite{bib:pas_cms_exo_19_019}. The ratio of the data yields after background subtraction to the background yields is shown on the bottom plots. The blue band represents the various statistical and systematic uncertainties on the background.

Dimuon invariant mass distributions of events selected with the standard and scouting dimuon triggers \cite{bib:cms_lowmass_dimuon}. The distribution shown in red corresponds to the data collected using the standard triggers, corresponding to a total integrated luminosity of 137 $\mathrm{fb^{-1}}$. The distribution shown in green corresponds to the data collected using the scouting muon triggers, corresponding to a total integrated luminosity of 96.6 $\mathrm{fb^{-1}}$. The inset figure shows the dimuon mass distribution of events in the barrel category in the mass range 23.9-26.1 GeV. A function describing the background is fit to this data and a 25 GeV dark photon signal is added.

Distribution of the two lepton two jet invariant mass in the signal region for the electron (left) and muon (right) channels \cite{bib:cms_excitedlepton}. The example signal shape for two excited lepton masses is indicated as a grey line with the parameters given in the legend. The panel below shows the data/MC ratio with the total uncertainty in grey.

The plot on the left shows an overview of total contributions (single bin) for the double muon object group, showing exclusive event that contain two muons and different number of jets and b-jets. The numbers on the top of each bin indicate the observed p-value for the agreement of data and simulation for the corresponding event class. The plot on the right shows the invariant mass distribution for the double muon exclusive event class. Measured data are shown as black markers, contributions from SM processes are represented by coloured bars, and the regions enclosed by red dashed lines correspond to the region of interest (contiguous set of bins with lowest p-value) \cite{bib:pas_cms_exo_19_008}.

The plot on the left shows an overview of total contributions (single bin) for the double muon object group, showing exclusive event that contain two muons and different number of jets and b-jets. The numbers on the top of each bin indicate the observed p-value for the agreement of data and simulation for the corresponding event class. The plot on the right shows the invariant mass distribution for the double muon exclusive event class. Measured data are shown as black markers, contributions from SM processes are represented by coloured bars, and the regions enclosed by red dashed lines correspond to the region of interest (contiguous set of bins with lowest p-value) \cite{bib:pas_cms_exo_19_008}.