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Example residual distribution for a HPK n-on-p sensor (S6), placed perpendicular to the beam and operated near the full depletion voltage (a), logarithmic scale (b). The outer dashed lines indicate $\pm3\times$RMS and the inner dashed lines indicate the {\it truncated RMS}.
Example residual distribution for a HPK n-on-p sensor (S6), placed perpendicular to the beam and operated near the full depletion voltage (a), logarithmic scale (b). The outer dashed lines indicate $\pm3\times$RMS and the inner dashed lines indicate the {\it truncated RMS}.
The intrapixel track positions for cluster sizes: size~1~(a), size~2~(b), size~3~(c) and size~4~(d) for an Micron n-on-p sensor (S25).
The intrapixel track positions for cluster sizes: size~1~(a), size~2~(b), size~3~(c) and size~4~(d) for an Micron n-on-p sensor (S25).
The intrapixel track positions for cluster sizes: size~1~(a), size~2~(b), size~3~(c) and size~4~(d) for an Micron n-on-p sensor (S25).
The intrapixel track positions for cluster sizes: size~1~(a), size~2~(b), size~3~(c) and size~4~(d) for an Micron n-on-p sensor (S25).
The fraction of size~1 (a) and size~2 (b) clusters as a function of the applied bias voltage. Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The fraction of size~1 (a) and size~2 (b) clusters as a function of the applied bias voltage. Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The fraction of size~1 and size~2 clusters for sensors uniformly irradiated to \maxfluence, placed perpendicular to the beam. Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The fraction of size~1 and size~2 clusters as a function of angle, (a) for non-irradiated and (b) for sensors irradiated uniformly to \maxfluence. Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The fraction of size~1 and size~2 clusters as a function of angle, (a) for non-irradiated and (b) for sensors irradiated uniformly to \maxfluence. Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The fraction of size~1 and size~2 clusters as a function of angle, (a) for non-irradiated and (b) for sensors irradiated uniformly to \maxfluence. Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
Efficiency as a function of bias voltage, for non-irradiated sensors (a) and irradiated sensors (b). The colour of the markers indicates the vendor and sensor type, where green is for HPK n-on-p, blue is for Micron n-on-p and purple for Micron n-on-n.
Efficiency as a function of bias voltage, for non-irradiated sensors (a) and irradiated sensors (b). The colour of the markers indicates the vendor and sensor type, where green is for HPK n-on-p, blue is for Micron n-on-p and purple for Micron n-on-n.
Cluster finding efficiency as a function of the intrapixel position for two 200\mum thick HPK sensors operated at 300~V uniformly irradiated to the full fluence of \maxfluence. The two sensors differ in implant size: S22 has an implant size of 35\mum (a) and S17 has an implant size of 39\mum (b).
Cluster finding efficiency as a function of the intrapixel position for two 200\mum thick HPK sensors operated at 300~V uniformly irradiated to the full fluence of \maxfluence. The two sensors differ in implant size: S22 has an implant size of 35\mum (a) and S17 has an implant size of 39\mum (b).
The spatial resolution as a function of bias voltage for non-irradiated sensors (a) and for uniformly irradiated sensors to the \maxfluence (b). Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The spatial resolution as a function of bias voltage for non-irradiated sensors (a) and for uniformly irradiated sensors to the \maxfluence (b). Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The spatial resolution as a function of angle for non-irradiated sensors operated at 200~V (a) and uniformly irradiated sensors to \maxfluence (b). Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
The spatial resolution as a function of angle for non-irradiated sensors operated at 200~V (a) and uniformly irradiated sensors to \maxfluence (b). Green for HPK n-on-p, blue for Micron n-on-p and purple for Micron n-on-n.
Spatial resolution (a) and the mean cluster size (b) as a function angle, for three different bias voltages for an non-irradiated HPK sensor (S6).
Spatial resolution (a) and the mean cluster size (b) as a function angle, for three different bias voltages for an non-irradiated HPK sensor (S6).
Spatial resolution (a) and the mean cluster size (b) as a function angle, for three different bias voltages for a HPK sensor (S6) uniformly irradiated to the full fluence of \SI{8e15}{\mevneq.}.
Spatial resolution (a) and the mean cluster size (b) as a function angle, for three different bias voltages for a HPK sensor (S6) uniformly irradiated to the full fluence of \SI{8e15}{\mevneq.}.
The spatial resolution (a) and the fraction of clusters (b) as a function of fluence, for an HPK sensor operated at 1000~V placed perpendicular to the beam.
The spatial resolution (a) and the fraction of clusters (b) as a function of fluence, for an HPK sensor operated at 1000~V placed perpendicular to the beam.
The reconstructed fluence profile from irradiation at IRRAD. The dosimetry results, converted to neutron equivalent fluence, for the six regions are indicated by the white numbers ($\times$\fluence).
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for three different applied voltage. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 100~V, 500~V and 1000~V from left to right. The example shown is for a HPK n-on-p (S9) sensor uniformly irradiated to \maxfluence.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.
The number of tracks as a function of the intrapixel track positions depending on cluster size for a 200~$\mum$ non-irradiated Micron n-on-p sensor (S25) at angles of 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ relative to the beam. The rows are size~1, size~2, size~3 and size~4 from top to bottom and the columns are 8$^{\circ}$, 16$^{\circ}$ and 22$^{\circ}$ from left to right.