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Abstract
| The volume-equivalent linear energy transfer approach (VELA) was previously proposed in combination with device characterization in a high-energy hadron (HEH) facility for the screening of commercial electronic devices to be used in space. This simplified approach allows determining the space single-event effect rate of a device due to protons and ions with the sole knowledge of the HEH cross-section (and without knowledge of the heavy ion cross-section or the sensitive volume characteristics). Given its simplicity, the method can be limited in terms of applicability to any single-event effect, but its boundaries are not yet known. The latter are investigated by means of Monte-Carlo simulations and experimental data sets to assess the applicability of the VELA to the single-event latchup. This evaluation shows that the main parameters of the VELA are, in fact, unaffected by the potential variability of the heavy ion response and the sensitive volume geometry of the device if a sufficient amount of latchups are observed during the HEH radiation test. However, due to its main approximation, the VELA starts losing its effectiveness when the spectral differences among the energy deposition distributions of the HEH radiation test and the space environment become more important. Nevertheless, such information is used to define the applicability boundaries of the method, which are expressed in terms of a minimum HEH latchup cross-section measured during the test. Finally, the variability of the main parameters of the method with respect to low-Earth orbit mission profiles is also assessed. |