Senger, Matias Borghi, Giacomo Boscardin, Maurizio Centis Vignali, Matteo Kilminster, Ben Macchiolo, Anna Paternoster, Giovanni Bisht, A Ficorella, F Hammad Ali, O Characterization of timing and spacial resolution of novel TI-LGAD structures before and after irradiation Publication Volume 1039 The characterization of spacial and timing resolution of the novel Trench Isolated LGAD (TI-LGAD) technology is presented. This technology has been developed at FBK with the goal of achieving 4D pixels, where an accurate position resolution is combined in a single device with the precise timing determination for Minimum Ionizing Particles (MIPs). In the TI-LGAD technology, the pixelated LGAD pads are separated by physical trenches etched in the silicon. This technology can reduce the interpixel dead area, mitigating the fill factor problem. The TI-RD50 production studied in this work is the first one of pixelated TI-LGADs. The characterization was performed using a scanning TCT setup with an infrared laser and a strontium source setup. ara Silicon sensors; Fast detectors; TI-LGAD; LGAD; Radiation; 4D-tracking; 2022

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