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<xml>
<records>
<record>
  <contributors>
    <authors>
      <author>Zheng Qi Wen</author>
      <author>Zhang Sheng Hu</author>
      <author>Gao Yihai</author>
      <author>Yu Qi</author>
      <author>Yu Ming Feng</author>
    </authors>
  </contributors>
  <titles>
    <title>Measurement of SSC RF cavity voltage with X-ray spectrum method</title>
    <secondary-title>Nucl. Electron. Detect. Technol.</secondary-title>
  </titles>
  <doi/>
  <pages>524-526</pages>
  <volume>22</volume>
  <number>6</number>
  <dates>
    <year>2002</year>
    <pub-dates>
      <date>2002</date>
    </pub-dates>
  </dates>
  <abstract>The author introduces the principle, method and results of RF voltage amplitude measurement by using X-ray energy spectrum. X-ray spectrum measurement method is one well-known method of absolute voltage measurement. It is based on the measurement of X-ray spectrum generated by field emitted (FE) electrons in RF cavity. The voltage amplitude of RF cavity measured by X-ray spectrum method is accurate and reliable. The DEE voltage of HIRFL-SSC cyclotron has been calibrated by X-ray spectrum measurement results</abstract>
</record>

</records>
</xml>