779133 SzGeCERN 20240223161113.0 INIS 34032751 chi Zheng Qi Wen Measurement of SSC RF cavity voltage with X-ray spectrum method 2002 The author introduces the principle, method and results of RF voltage amplitude measurement by using X-ray energy spectrum. X-ray spectrum measurement method is one well-known method of absolute voltage measurement. It is based on the measurement of X-ray spectrum generated by field emitted (FE) electrons in RF cavity. The voltage amplitude of RF cavity measured by X-ray spectrum method is accurate and reliable. The DEE voltage of HIRFL-SSC cyclotron has been calibrated by X-ray spectrum measurement results SIS INIS2004 Measurement of SSC RF cavity voltage with X-ray spectrum method SIS APAC01-2005 SIS:2005 PR/LKR added SzGeCERN Accelerators and Storage Rings ARTICLE INIS Particle accelerators INIS bremsstrahlung- INIS cavity-resonators INIS electric-potential INIS hirfl-cyclotron INIS measuring-methods INIS rf-systems INIS x-ray-spectra INIS accelerators- INIS cyclic-accelerators INIS cyclotrons- INIS electromagnetic-radiation INIS electronic-equipment INIS equipment- INIS heavy-ion-accelerators INIS isochronous-cyclotrons INIS radiations- INIS resonators- INIS spectra- Zhang Sheng Hu Gao Yihai Yu Qi Yu Ming Feng 524-526 6 Nucl. Electron. Detect. Technol. 22 2002 https://accelconf.web.cern.ch/a01/PDF/THP031.pdf Published version from JACoW n 200430 13 20060109 1102 CER01 20040720 517051 THP031 beijing20010917 PUBLIC 002469628CER ARTICLE