<?xml version="1.0" encoding="UTF-8"?>
<references>
<reference>
  <a1>Zheng Qi Wen</a1>
  <a2>Zhang Sheng Hu</a2>
  <a2>Gao Yihai</a2>
  <a2>Yu Qi</a2>
  <a2>Yu Ming Feng</a2>
  <t1>Measurement of SSC RF cavity voltage with X-ray spectrum method</t1>
  <t2>Nucl. Electron. Detect. Technol.</t2>
  <sn/>
  <op>524-526</op>
  <vo>22</vo>
  <ab>The author introduces the principle, method and results of RF voltage amplitude measurement by using X-ray energy spectrum. X-ray spectrum measurement method is one well-known method of absolute voltage measurement. It is based on the measurement of X-ray spectrum generated by field emitted (FE) electrons in RF cavity. The voltage amplitude of RF cavity measured by X-ray spectrum method is accurate and reliable. The DEE voltage of HIRFL-SSC cyclotron has been calibrated by X-ray spectrum measurement results</ab>
  <la>chi</la>
  <k1/>
  <pb/>
  <pp/>
  <yr>2002</yr>
  <ed/>
  <ul>https://accelconf.web.cern.ch/a01/PDF/THP031.pdf;
	</ul>
  <no>Imported from Invenio.</no>
</reference>

</references>