| Home > Measurement of SSC RF cavity voltage with X-ray spectrum method |
| Article | |
| Title | Measurement of SSC RF cavity voltage with X-ray spectrum method |
| Author(s) | Zheng Qi Wen ; Zhang Sheng Hu ; Gao Yihai ; Yu Qi ; Yu Ming Feng |
| Publication | 2002 |
| In: | Nucl. Electron. Detect. Technol. 22, 6 (2002) pp.524-526 |
| In: | 2nd Asian Particle Accelerator Conference, Beijing, China, 17 - 21 Sep 2001, pp.THP031 |
| Subject category | Accelerators and Storage Rings |
| Abstract | The author introduces the principle, method and results of RF voltage amplitude measurement by using X-ray energy spectrum. X-ray spectrum measurement method is one well-known method of absolute voltage measurement. It is based on the measurement of X-ray spectrum generated by field emitted (FE) electrons in RF cavity. The voltage amplitude of RF cavity measured by X-ray spectrum method is accurate and reliable. The DEE voltage of HIRFL-SSC cyclotron has been calibrated by X-ray spectrum measurement results |