000915071 001__ 915071
000915071 003__ SzGeCERN
000915071 005__ 20240223162900.0
000915071 041__ $$aeng
000915071 100__ $$aHe, Chaohui
000915071 245__ $$aExperimental Study on Single Event Effects in Semiconductor Devices Using Accelerators
000915071 260__ $$c2001
000915071 595__ $$aSIS APAC01-2005
000915071 65017 $$2SzGeCERN$$aAccelerators and Storage Rings
000915071 690C_ $$aARTICLE
000915071 700__ $$aYang Hai Liang
000915071 700__ $$aGeng, Bin
000915071 700__ $$aChen Xiao Hua
000915071 700__ $$aZhang, Zhengxuan
000915071 700__ $$aLi, Guozheng
000915071 8564_ $$uhttps://accelconf.web.cern.ch/a01/PDF/WEP081.pdf$$yPublished version from JACoW
000915071 916__ $$sn$$w200550
000915071 960__ $$a13
000915071 961__ $$c20070716$$h1357$$lCER01$$x20051213
000915071 963__ $$aPUBLIC
000915071 962__ $$b517051$$kWEP081$$nbeijing20010917
000915071 970__ $$a002584634CER
000915071 980__ $$aARTICLE