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  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 1-3: General - The effects of high-altitude EMP (HEMP) on civil equipment and systems</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC-TR-61000-1-3</dc:publisher>
  <dc:date>2002</dc:date>
  <dc:source>http://cds.cern.ch/record/970677</dc:source>
  <dc:identifier>http://cds.cern.ch/record/970677</dc:identifier>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:creator>British Standards Institution. London</dc:creator>
  <dc:creator>European Committee for Standardization. Brussels</dc:creator>
  <dc:title>Electromagnetic comptability (EMC): part 3-2: limits-limits for harmonic curent emissions</dc:title>
  <dc:subject>Information Transfer and Management</dc:subject>
  <dc:publisher>BSI</dc:publisher>
  <dc:date>2000</dc:date>
  <dc:source>http://cds.cern.ch/record/845779</dc:source>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
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  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): part 4-6 : testing and measurement techniques : immunity to conducted disturbances, induced by radio-frequency fields</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2008</dc:date>
  <dc:source>http://cds.cern.ch/record/828777</dc:source>
  <dc:identifier>http://cds.cern.ch/record/828777</dc:identifier>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): part 4-4 : testing and measurement techniques : electrical fast transient/burst immunity test</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2004</dc:date>
  <dc:source>http://cds.cern.ch/record/828775</dc:source>
  <dc:identifier>http://cds.cern.ch/record/828775</dc:identifier>
  <invenio:conference.notes>Includes: Corrigendum 1, 2 p (2006) + Corrigendum 2, 2 p (2007) + Amendment A1, 10 p (2010)</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
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  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 4-30: Testing and measurement techniques - Power quality measurement methods</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2003</dc:date>
  <dc:source>http://cds.cern.ch/record/732085</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732085</dc:identifier>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - Equipment with rated current $\le$ 75 A and subjet to conditional connection</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2000</dc:date>
  <dc:source>http://cds.cern.ch/record/732084</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732084</dc:identifier>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 3: Limits - Section 7: Assessment of emission limits for fluctuating loads in MV and HV power systems - Basic EMC publication</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1996</dc:date>
  <dc:source>http://cds.cern.ch/record/732083</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732083</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 3: Limits - Section 6: Assessment of emission limits for distorting loads in MV and HV power systems - Basic EMC publication</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
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  <dc:source>http://cds.cern.ch/record/732082</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732082</dc:identifier>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 3: Limits - Section 5: Limitation of voltage fluctuations and flicker in low-voltage power supply systems for equipment with rated current greater than 16 A</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1994</dc:date>
  <dc:source>http://cds.cern.ch/record/732081</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732081</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 3-4: Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1998</dc:date>
  <dc:source>http://cds.cern.ch/record/732080</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732080</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current $\le$ 16 A per phase and not subject to conditional connection</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2002</dc:date>
  <dc:source>http://cds.cern.ch/record/732079</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732079</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 3-2: Limits - Limits for harmonic current emissions (equipment input current $\le$ 16 A per phase)</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2001</dc:date>
  <dc:source>http://cds.cern.ch/record/732078</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732078</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 2-4: Environment - Compatibility levels in industrial plants for low-frequency conducted disturbances</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2002</dc:date>
  <dc:source>http://cds.cern.ch/record/732077</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732077</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 2: Environment - Section 3: Description of the environment - Radiated and non-network-frequency-related conducted phenomena</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1992</dc:date>
  <dc:source>http://cds.cern.ch/record/732076</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732076</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 2-2: Environment - Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2002</dc:date>
  <dc:source>http://cds.cern.ch/record/732075</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732075</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): Part 2 : Environment - Section 1: Description of the environment - Electromagnetic environment for low-frequency conducted disturbances and signalling in public power supply systems</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1990</dc:date>
  <dc:source>http://cds.cern.ch/record/732072</dc:source>
  <dc:identifier>http://cds.cern.ch/record/732072</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 6: Generic standards - Section 4: Emission standard for industrial environments</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:description>This standard for emission requirements applies to electrical and electronic apparatus intended for use in the industrial locations (both indoor and outdoor, or in proximity to industrial power installations) for which no designed product or product-family emission standard exists. Disturbances in the frequency range 0 Hz to 400 GHz are covered.</dc:description>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1997</dc:date>
  <dc:source>http://cds.cern.ch/record/606318</dc:source>
  <dc:identifier>http://cds.cern.ch/record/606318</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): part 6-2 : generic standards : immunity for industrial environments</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:description>Applies to electrical and electronic apparatus intended for use in industrial environments, for which no designed product or product-family immunity standard exists. Immunity requirements in the frequency range 0 Hz to 400 GHz are covered, in relation to continuous and transient, conducted and radiated disturbances, including electrostatic discharges. Test requirements are specified for each port considered. Apparatus intended to be used in industrial locations are characterized by the existence of one or more of the following: - a power network exists powered by a high or medium voltage power transformer for the supply of an installation feeding manufacturing or similar plant; - industrial, scientific and medical (ISM) apparatus; - heavy inductive or capacitive loads are frequently switched; - currents and associated magnetic fields are high.</dc:description>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2005</dc:date>
  <dc:source>http://cds.cern.ch/record/606317</dc:source>
  <dc:identifier>http://cds.cern.ch/record/606317</dc:identifier>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>fre</dc:language>
  <dc:language>eng</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Immunite a l'iem-ha spc.dispos de protection rayonnements</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1996</dc:date>
  <dc:source>http://cds.cern.ch/record/502710</dc:source>
  <dc:identifier>http://cds.cern.ch/record/502710</dc:identifier>
  <invenio:conference.notes>The document can be consulted by contacting: EN-EL : Cédric Patou</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>fre</dc:language>
  <dc:language>eng</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Fluctuations de tension</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>1982</dc:date>
  <dc:source>http://cds.cern.ch/record/502457</dc:source>
  <dc:identifier>http://cds.cern.ch/record/502457</dc:identifier>
  <invenio:conference.notes>The document can be consulted by contacting: EN-EL : Cédric Patou</invenio:conference.notes>
  <invenio:conference.notes>Withdrawn. Replaced by IEC 61000-3-2 (1995)</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity test</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2001</dc:date>
  <dc:source>http://cds.cern.ch/record/497110</dc:source>
  <dc:identifier>http://cds.cern.ch/record/497110</dc:identifier>
  <invenio:conference.notes>The document can be consulted by contacting: EN-EL : Cédric Patou</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 4-9: Testing and measurement techniques - Pulse magnetic field immunity test</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2001</dc:date>
  <dc:source>http://cds.cern.ch/record/497108</dc:source>
  <dc:identifier>http://cds.cern.ch/record/497108</dc:identifier>
  <invenio:conference.notes>The document can be consulted by contacting: EN-EL : Cédric Patou</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2001</dc:date>
  <dc:source>http://cds.cern.ch/record/497107</dc:source>
  <dc:identifier>http://cds.cern.ch/record/497107</dc:identifier>
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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC) - Part 4-10: Testing and measurement techniques - Damped oscillatory magnetic field immunity test</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2001</dc:date>
  <dc:source>http://cds.cern.ch/record/497106</dc:source>
  <dc:identifier>http://cds.cern.ch/record/497106</dc:identifier>
  <invenio:conference.notes>The document can be consulted by contacting: EN-EL : Cédric Patou</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:creator>British Standards Institution. London</dc:creator>
  <dc:title>Electromagnetic compatibility. Generic immunity standard. Industrial environment</dc:title>
  <dc:subject>Information Transfer and Management</dc:subject>
  <dc:publisher>BSI</dc:publisher>
  <dc:date>1995</dc:date>
  <dc:source>http://cds.cern.ch/record/441640</dc:source>
  <dc:identifier>http://cds.cern.ch/record/441640</dc:identifier>
  <invenio:conference.notes>Replaced By: BS EN 61000-6-2:1999, Replaced by BS EN 61000-6-2:1999 but remains current.</invenio:conference.notes>
</dc:dc>

<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:language>eng</dc:language>
  <dc:language>fre</dc:language>
  <dc:creator>International Electrotechnical Commission. Geneva</dc:creator>
  <dc:title>Electromagnetic compatibility (EMC): part 4-6 : testing and measurement techniques : immunity to conducted disturbances, induced by radio-frequency fields</dc:title>
  <dc:subject>Engineering</dc:subject>
  <dc:publisher>IEC</dc:publisher>
  <dc:date>2004</dc:date>
  <dc:source>http://cds.cern.ch/record/2286355</dc:source>
  <dc:identifier>http://cds.cern.ch/record/2286355</dc:identifier>
  <invenio:conference.notes>Edition 2 (2003) consolidated with amendment 1 (2004)</invenio:conference.notes>
  <invenio:conference.notes>Includes: Amendment 1 (2004) and Amendment 2 (2004)</invenio:conference.notes>
</dc:dc>


</collection>