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Defect generation by radioactive decay of light elements in n-type silicon / Bollmann, J ; Thieme, M ; Weber, J /ISOLDE Collaboration
2006 - Published in : Physica B 376-377 (2006) 97-100
In : 23rd International Conference on Defects in Semiconductors, Hyogo, Japan, 24 - 29 Jul 2005, pp.97-100
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